XRD and Electron-Microscopy Investigations of Layer Silicates

XRD and Electron-Microscopy Investigations of Layer Silicates – The Canadian Mineralogist Vol. 36, part 6

Editors: R.F. Martin

A demonstration of the power of a combined XRD-TEM approach in the study of layer silicates.

These are original publications and are not newly printed. Copies are complete but may exhibit shelf wear, edge wear, discoloration, or other signs of handling and long-term storage consistent with their age. Condition may vary slightly between copies.

Softcover. 242 pages. 1998.